神经形态工程学
记忆电阻器
材料科学
蛋白质丝
空位缺陷
纳米技术
氧气
光电子学
工程物理
凝聚态物理
电子工程
人工神经网络
计算机科学
复合材料
物理
人工智能
量子力学
工程类
作者
Chenyu Zhuge,Jiandong Jiang,L. Chen,Zhichao Xie,Guangyue Shen,Yujun Fu,Qi Wang,Deyan He
标识
DOI:10.1021/acsami.5c02955
摘要
Memristors, as neural synapse devices, have been regarded as excellent candidates for non-von Neumann architecture because of their high scalability. However, the randomness of the filaments of state-of-the-art filamentary memristors leads to high variability and poor reliability. Herein, a semimetal bismuth (Bi)-based memristor with oxygen vacancy (VO)-Bi filaments was proposed. The Bi-based memristor has a subquantum conductance change, high switching consistency, and controllable weight update linearity. Through spherical aberration-corrected scanning transmission electron microscopy (AC-STEM) and density functional theory (DFT) calculations, the formation mechanism of VO and Bi clusters in the filaments and the overall switching mechanism of the VO-Bi filaments were elucidated. Specifically, VO provides a conductive path while Bi ions migrate, leading to the reduction of Bi clusters in the SiO2 layer. Furthermore, artificial neural network (ANN) simulations based on back-propagation and reservoir computing (RC) systems achieved large digit recognition accuracies of 95.77 and 94.15%, respectively.
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