Highly Oriented Pyrolytic Graphite by XPS

X-ray photoelectron spectroscopy (XPS) was used to characterize a highly oriented pyrolytic graphite (HOPG) sample. The HOPG was cleaved using scotch tape prior to introduction into an ultrahigh vacuum analytical chamber. No further cleaning was used as no elements other than carbon were detected in XPS survey scans. Electron energy loss spectroscopy (EELS) spectra obtained by x-ray excitation of the C 1s level can be used as a fingerprint for distinguishing graphite from diamond or carbides [see D. N. Belton and S. J. Schiemg, J. Vac. Technol. A 8, 2353 (1990)].