材料科学
金刚石顶砧
钻石
复合材料
高压
电导率
薄膜
温度测量
样品(材料)
分析化学(期刊)
机械
热力学
纳米技术
化学
物理
物理化学
色谱法
作者
D. A. Golopentia,A. L. Ruoff
摘要
A new type of apparatus for high-pressure experiments at low temperature (1.5 °K) is presented. It uses a flat diamond anvil with a spherical indentor. It utilizes a load ring placed under the sample, so that the load (and hence pressure) can be measured in situ at low temperature. The apparatus was successfully used to investigate the high-conductivity state of sulphur. It can be used to investigate other thin film samples.
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