材料科学
铁电性
二硫化钼
光电子学
铁电电容器
晶体管
非易失性存储器
电压
场效应晶体管
电场
数码产品
电气工程
电容
纳米技术
半导体
阈值电压
电力电子
逻辑门
低压
电极
高压
工程物理
碳纳米管
作者
Dehuan Meng,Xuezhou Ma,Zizhuo Shen,Lin Xu,Lian-Mao Peng,Chenguang Qiu
出处
期刊:Science Advances
[American Association for the Advancement of Science]
日期:2026-02-13
卷期号:12 (7): eaea5020-eaea5020
被引量:1
标识
DOI:10.1126/sciadv.aea5020
摘要
Ferroelectric field-effect transistors (FeFETs), as an electric field–driven nonvolatile memory, offer extremely low power consumption and high speed. Despite efforts, FeFETs have not been successfully scaled down to sub–5-nanometer-node technology, with their operational voltage exceeding 1.5 V, making them unable to match monolithic logic cores. Our study used metallic single-walled carbon nanotubes as gate electrodes to shrink the gate length of molybdenum disulfide FeFET to 1 nanometer. This nanogate approach leads to an electric field concentration and enhanced ferroelectric–to–metal-oxide semiconductor capacitance coupling, resulting in a reduced operating voltage of 0.6 V, below the conventional ferroelectric coercive voltage. The nanogate molybdenum disulfide FeFETs exhibit superior memory performance, with a substantial current on/off ratio of 2 × 10 6 and a rapid programming speed of 1.6 nanoseconds. This study demonstrates the immunity of nanogate FeFETs to short-channel effects, highlighting the notable potential of ferroelectric electronics for enabling superior scaling, performance, and energy efficiency in sub–1-nanometer-node chips.
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