散射
超晶格
电子
材料科学
凝聚态物理
电子迁移率
杂质
电离杂质散射
电离
表面光洁度
电子散射
载流子散射
物理
光学
离子
复合材料
量子力学
作者
Sara Safa,Asghar Asgari
标识
DOI:10.1142/s021798491650384x
摘要
The in-plane electron mobility has been calculated in InAs/GaSb type-II superlattices (SLs) at low temperatures. The interface roughness scattering and ionized impurity scattering are investigated as the dominant scattering mechanisms in limiting the electron transport at low temperatures. For this purpose, the band structures and wave functions of electrons in such SLs are calculated by solving the K.P Hamiltonian using the numerical Finite Difference method. The scattering rates have been obtained for different temperatures and structural parameters. We show that the scattering rates are high in thin-layer SLs and the mobility rises as the temperature increases in low-temperature regime.
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