光学
材料科学
可见光谱
宽带
相(物质)
光电子学
干涉测量
折射
翻译(生物学)
色散(光学)
波前
传输(电信)
硅
氮化硅
图像质量
薄脆饼
折射率
相位控制
扫描仪
质量(理念)
二氧化钛
反射(计算机编程)
相位调制
光学涂层
纳米光子学
作者
Hyun Sung Park,Hyeonsoo Park,Hae-Sung Kim,Junho Lee,Jeong Yub Lee,Eun-Hyoung Cho,Kideok Bae,Woong Ko,Jaeduck Jang,Sookyoung Roh,Sungmo Ahn,Seung-Hoon Han,Seokho Yun
出处
期刊:Nano Letters
[American Chemical Society]
日期:2026-09-04
标识
DOI:10.1021/acs.nanolett.6c02688
摘要
Abstract Metalenses offer a pathway toward flat, wafer-level optics, but their translation to mobile imaging has been hindered by the difficulty of achieving broadband performance at millimeter-scale apertures. Here we report a visible metalens that imparts a wavelength-invariant phase profile in a hybrid configuration with refractive elements. Central to this advance is a dispersion-contrasting metasurface that achieves broadband phase control using simple, photolithography-compatible nanostructures. Built from stacked silicon nitride nanohole and titanium dioxide nanopost arrays with opposite dispersion sensitivities, the device independently controls phase and group delay while maintaining high transmission across the visible. Integrated with refractive optics, it produces full-color photographic images free of visible artifacts under conditions representative of mobile camera modules. Interferometric measurements show that image quality is governed by phase fidelity of the metalens, demonstrating that accurate, manufacturable phase control provides a viable route toward integrating visible metalenses into compact imaging systems.
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