材料科学
光探测
光电探测器
光电子学
暗电流
纳米线
异质结
光电二极管
光学
灵敏度(控制系统)
光电流
量子效率
红外线的
噪音(视频)
光刻胶
光子
图像传感器
热辐射计
石墨烯
激光器
光电导性
光子计数
雪崩光电二极管
平面的
砷化铟镓
量子点
夜视
比探测率
半导体
光通信
作者
Kosala Dhanawansha,Chaohao Chen,Zhe Li,Tuomas Haggrén,Dawei Liu,Yang Yu,Baolei Liu,Sanjay Krishna,Hark Hoe Tan,C. Jagadish,Lan Fu
摘要
ABSTRACT Shortwave infrared (SWIR) photodetection and imaging are of increasing importance for many emerging applications, such as optical and quantum communications, night vision, biomedical imaging and sensing. While planar InGaAs and Ge‐based SWIR photodetectors are the current state‐of‐the‐art, it is challenging to achieve single‐photon level sensitivity at non‐cryogenic temperatures due to their high dark current and thermal noise. Here, we demonstrate a highly sensitive self‐powered InGaAs nanowire photodetector with single‐photon‐level sensitivity at 1310 nm. The device utilizes a p+ InGaAs/Indium Tin Oxide (ITO) radial heterojunction nanowire structure, enabling strong optical confinement and efficient carrier extraction. It demonstrates a detection sensitivity down to 118.1 pW at room temperature and 6.5 pW at 223 K, corresponding to two photons per pulse of a 1310 nm laser excitation at 20 MHz with the noise equivalent powers of 1.59 × 10 −13 W Hz −1/2 and 2.18 × 10 −15 W Hz −1/2 respectively. The photodetector maintains a high signal‐to‐noise ratio of 58 dB at 1550 nm and cut‐off frequency of 15 MHz. Also, single‐pixel imaging under illumination down to ∼580 µW cm − 2 , showcasing the robust imaging capability under extremely low‐light conditions. Our results highlight the potential of nanowire‐based heterojunction photodetectors for the development of next‐generation, low‐cost, high‐performance SWIR photodetection and imaging technology.
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