多光谱图像
光电探测器
光学
磷
材料科学
光电子学
黑磷
分辨率(逻辑)
物理
遥感
计算机科学
地质学
人工智能
冶金
作者
Michael Engel,M. Steiner,Phaedon Avouris
出处
期刊:Nano Letters
[American Chemical Society]
日期:2014-10-15
卷期号:14 (11): 6414-6417
被引量:574
摘要
Black phosphorus is a layered semiconductor that is intensely researched in view of applications in optoelectronics.In this Letter, we investigate a multi-layer black phosphorus photo-detector that is capable of acquiring high-contrast (V>0.9)images both in the visible (λ VIS =532nm) as well as in the infrared (λ IR =1550nm) spectral regime.In a first step, by using photocurrent microscopy, we map the active area of the device and we characterize responsivity and gain.In a second step, by deploying the black phosphorus device as a point-like detector in a confocal microsope setup, we acquire diffraction-limited optical images with sub-micron resolution.The results demonstrate the usefulness of black phosphorus as an optoelectronic material for hyperspectral imaging applications.
科研通智能强力驱动
Strongly Powered by AbleSci AI