计算机科学
维数之咒
二进制数
人工智能
财产(哲学)
材料科学
模式识别(心理学)
数据挖掘
降维
绝缘体(电)
机器学习
数学
哲学
算术
光电子学
认识论
作者
Runhai Ouyang,Stefano Curtarolo,Emre Ahmetcik,Matthias Scheffler,Luca M. Ghiringhelli
标识
DOI:10.1103/physrevmaterials.2.083802
摘要
The lack of reliable methods for identifying descriptors - the sets of parameters capturing the underlying mechanisms of a materials property - is one of the key factors hindering efficient materials development. Here, we propose a systematic approach for discovering descriptors for materials properties, within the framework of compressed-sensing based dimensionality reduction. SISSO (sure independence screening and sparsifying operator) tackles immense and correlated features spaces, and converges to the optimal solution from a combination of features relevant to the materials' property of interest. In addition, SISSO gives stable results also with small training sets. The methodology is benchmarked with the quantitative prediction of the ground-state enthalpies of octet binary materials (using ab initio data) and applied to the showcase example of predicting the metal/insulator classification of binaries (with experimental data). Accurate, predictive models are found in both cases. For the metal-insulator classification model, the predictive capability are tested beyond the training data: It rediscovers the available pressure-induced insulator->metal transitions and it allows for the prediction of yet unknown transition candidates, ripe for experimental validation. As a step forward with respect to previous model-identification methods, SISSO can become an effective tool for automatic materials development.
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