Growth and characterization of uranium oxide thin films deposited by polymer assisted deposition

Abstract A thin film of uranium oxide was deposited by polymer assisted deposition on a single crystal lanthanum aluminate - strontium aluminum tantalate substrate. The deposition resulted in formation of epitaxial thin film of uranium oxide, which could be attributed to α-U3O8 or α-UO3. X-ray diffraction revealed preferential orientation along (100) in case of α-U3O8 or (001) for α-UO3 for the thin film. A combination of x-ray and neutron reflectometry proved the sample to be α-U3O8. The film was of 17 nm thickness covered by a capping layer. The less dense capping layer could be a manifestation of surface water adsorbed on the sample.