Fidelity benchmarks for two-qubit gates in silicon
作者
W. Huang,C. H. Yang,K. W. Chan,T. Tanttu,B Hensen,R. C. C. Leon,M. A. Fogarty,J. C. C. Hwang,Fay E. Hudson,K.M. Itoh,Morello A,A. Laucht,Andrew S. Dzurak,W. Huang,C. H. Yang,K. W. Chan,T. Tanttu,B Hensen,R. C. C. Leon,M. A. Fogarty
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(2025-6-4)
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