A Common Framework Solution for Firmware Test on V93000 ATE Platform

With the development of semiconductors industry. Screening and characterization test of high-performance chips on ATE (Automatic Test Equipment) are facing much more challenges. In order to improve test coverage and efficiency, more and more IPs are being tested on ATE using firmware test. This paper provides a common framework solution for V93000 to implement firmware test. At the same time, an innovation HTOL (high-temperature operation life test) and CHAR (characterization) test framework is introduced in this paper.