Logic-Gate-Based Scan Driver Circuits With Low-Temperature Polycrystalline Silicon and Metal-Oxide Thin-Film Transistor Technology

This article presents novel scan driver circuits for active-matrix display panels based on CMOS logic gates and hybrid thin-film transistor (TFT) technology. In the proposed design, the logic and output parts are separated and implemented using distinct methods to address the limitations of amorphous indium gallium zinc oxide (a-IGZO) TFTs and single-channel-type circuits. Two types of scan driver circuits were designed and simulated to meet a refresh rate of 120 Hz and a resolution of $1440\times 2560$ . The fabricated circuits were evaluated by measuring the output voltage waveforms across ten stages under the same simulation conditions, confirming their operational feasibility. The proposed method enhances the flexibility of circuit design for hybrid TFT-based high-resolution display panels.