材料科学
响应度
光电子学
电介质
铋
光电探测器
化学气相沉积
比探测率
异质结
带隙
冶金
作者
Suraj Lakhchaura,M. A. Gokul,Atikur Rahman
出处
期刊:Nanotechnology
[IOP Publishing]
日期:2023-11-10
卷期号:35 (7): 075707-075707
被引量:8
标识
DOI:10.1088/1361-6528/ad0bd3
摘要
Abstract Bismuth oxyselenide has recently gained tremendous attention as a promising 2D material for next-generation electronic and optoelectronic devices due to its ultrahigh mobility, moderate bandgap, exceptional environmental stability, and presence of high-dielectric constant native oxide. In this study, we have synthesized single-crystalline nanosheets of Bismuth oxyselenide with thicknesses measuring below ten nanometers on Fluorophlogopite mica using an atmospheric pressure chemical vapor deposition system. We transferred as-grown samples to different substrates using a non-corrosive nail polish-assisted dry transfer method. Back-gated Bi2O2Se field effect transistors showed decent field effect mobility of 100 cm2 V−1s−1. The optoelectronic property study revealed an ultrahigh responsivity of 1.16 × 106 A W−1 and a specific detectivity of 2.55 × 1013 Jones. The samples also exhibited broadband photoresponse and gate-tunable photoresponse time. These results suggest that Bi2O2Se is an excellent candidate for future high-performance optoelectronic device applications.
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