可解释性
平版印刷术
计算机科学
极紫外光刻
反向
过程(计算)
人工神经网络
算法
电子工程
计算机工程
材料科学
人工智能
纳米技术
光电子学
工程类
数学
操作系统
几何学
作者
Binwu Zhu,Su Zheng,Ziyang Yu,Guojin Chen,Yuzhe Ma,Fan Yang,Bei Yu,Martin D. F. Wong
标识
DOI:10.1109/tcad.2023.3323164
摘要
Inverse lithography technique (ILT) is one of the most widely used resolution enhancement techniques (RETs) to compensate for the diffraction effect in the lithography process. However, ILT suffers from runtime overhead issues with the shrinking size of technology nodes. In this article, our proposed L2O-ILT framework unrolls the iterative ILT optimization algorithm into a learnable neural network with high interpretability, which can generate a high-quality initial mask for fast refinement. Experimental results demonstrate that our method achieves better performance on both mask printability and runtime than the previous methods.
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