铁电性
薄膜
纳米结构
光电子学
显微镜
纳米尺度
结晶学
作者
Christopher J. Brennan,Rudresh Ghosh,Kalhan Koul,Sanjay K. Banerjee,Nanshu Lu,Edward T. Yu
出处
期刊:Nano Letters
[American Chemical Society]
日期:2017-08-03
卷期号:17 (9): 5464-5471
被引量:68
标识
DOI:10.1021/acs.nanolett.7b02123
摘要
Two-dimensional (2D) materials have recently been theoretically predicted and experimentally confirmed to exhibit electromechanical coupling. Specifically, monolayer and few-layer molybdenum disulfide (MoS2) have been measured to be piezoelectric within the plane of their atoms. This work demonstrates and quantifies a nonzero out-of-plane electromechanical response of monolayer MoS2 and discusses its possible origins. A piezoresponse force microscope was used to measure the out-of-plane deformation of monolayer MoS2 on Au/Si and Al2O3/Si substrates. Using a vectorial background subtraction technique, we estimate the effective out-of-plane piezoelectric coefficient, d33eff, for monolayer MoS2 to be 1.03 ± 0.22 pm/V when measured on the Au/Si substrate and 1.35 ± 0.24 pm/V when measured on Al2O3/Si. This is on the same order as the in-plane coefficient d11 reported for monolayer MoS2. Interpreting the out-of-plane response as a flexoelectric response, the effective flexoelectric coefficient, μeff*, is estim...
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