温度循环
互连
材料科学
降级(电信)
压力(语言学)
风化作用
动力循环
晶体硅
工作(物理)
环境科学
温度测量
压力测试(软件)
加速老化
硅
热的
功率(物理)
复合材料
可靠性(半导体)
计算机科学
机械工程
地质学
光电子学
气象学
哲学
计算机网络
程序设计语言
语言学
工程类
物理
地貌学
电信
量子力学
作者
W. Herrmann,N. Bogdanski,F. Reil,M. Köhl,Karl‐Anders Weiß,Marcus Aßmus,Markus Heck
摘要
Temperature cycling tests are part of the IEC 61215 qualification testing of crystalline silicon (c-Si) PV modules for evaluating PV module degradation caused by the impact of thermo-mechanically induced stresses. The defined temperature gradient and the cycle time by far exceed the actual impact of natural weathering, however. As a contribution to comparisons between laboratory testing and natural weathering our work provides data from standard temperature cycling tests as defined in IEC 61215 and extended from 200 (standard) to 800 cycles. The results of these tests for seven commercial c-Si PV modules from various manufacturers are compared with results from identical module types exposed outdoors in different climates for a period of 3 years. Degradation effects are evaluated with respect to changes in output power, changes in insulation properties and with respect to interruptions in the electrical interconnection circuits such as cell interconnects. Temperature gradients obtained at the different exposure locations are used to model the thermo-mechanical stress arising from the mismatches of the thermal expansion coefficients of the employed materials.
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