卤化物
钙钛矿(结构)
碘
材料科学
工程物理
化学
无机化学
环境科学
纳米技术
化学工程
物理
工程类
冶金
作者
Gábor Szabó,Masaru Kuno,Prashant V. Kamat
出处
期刊:ACS energy letters
[American Chemical Society]
日期:2025-08-24
卷期号:10 (9): 4378-4385
被引量:4
标识
DOI:10.1021/acsenergylett.5c02199
摘要
Understanding processes that contribute to efficiency losses during long-term operation of perovskite solar cells is crucial for achieving operational stability. Although maximum power point tracking optimizes outdoor performance, it is not uncommon that devices are kept under open-circuit conditions during sunny hours. Under these conditions, charge carriers accumulate at the interfaces rather than flowing through the circuit. In the case of the MAPbI3/spiro-OMeTAD interface studied here, hole accumulation leads to formation of I2 and subsequent oxidation of spiro-OMeTAD. By employing in situ absorption measurements, we show that the decrease in power conversion efficiency follows the spiro-OMeTAD oxidation while operating the device under open-circuit conditions. In short-circuit conditions, where photogenerated charge carriers are extracted in the external circuit, the I2-induced oxidation of spiro-OMeTAD and the device instability are minimized. The photoinduced expulsion of iodine from MAPbI3 into spiro-OMeTAD discussed in this study provides new insight into the photoinstability of perovskite solar cells.
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