光学
显微镜
分辨率(逻辑)
材料科学
曲率
厘米
比例(比率)
物理
计算机科学
天文
几何学
数学
量子力学
人工智能
作者
Xi Yang,Haitao Chen,Lucas Kreiß,Clare Cook,Genevieve M. Kuczewski,Mark Harfouche,Martin O. Bohlen,Roarke Horstmeyer
出处
期刊:Optics Letters
[Optica Publishing Group]
日期:2025-08-15
卷期号:50 (19): 5977-5977
被引量:2
摘要
Large-area microscopy with submicron resolution is limited by tradeoffs between field of view (FOV), resolution, and imaging speed. Samples are rarely flat across centimeter-scale FOV, which often requires existing solutions to use mechanical scanning to ensure focused capture at reduced throughput. Here, we present PANORAMA, a single-shot, re-imaging microscope that achieves seamless, gigapixel imaging over a 16.3 × 18.8 mm2 FOV at 0.84 µm half-pitch resolution without mechanical scanning. By using a telecentric photolithography lens, a large-aperture tube lens, and a flat micro-camera array with adaptive per-camera focus control, PANORAMA maintains submicron focus across flat, curved, or uneven samples that span centimeters. This approach improves imaging throughput and adaptability, enabling gigapixel multi-modal microscopy of large flat and non-flat samples in one shot, thus broadening its applications in biomedical and materials imaging.
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