飞秒
材料科学
载流子
硅
吸收(声学)
平面的
激光器
超快激光光谱学
光电子学
分析化学(期刊)
波长
原子物理学
光学
化学
物理
计算机图形学(图像)
色谱法
计算机科学
复合材料
作者
Sebastian Pape,E. Currás Rivera,M. Fernández,M. Moll,Moritz Wiehe
标识
DOI:10.1016/j.nima.2023.168387
摘要
The effect of temperature on the excess charge carrier generation and collection, injected using two photon absorption at a wavelength of 1550 nm, is investigated in a 285 μm thick, p-type silicon planar detector, with a bulk resistivity of 3.7 kΩ cm. Charge collection measurements are performed for temperatures between −20 °C to 20 °C. The collected charge decreases by about 8% when the temperature is lowered from 20 °C to −20 °C, which is linked to a decreasing excess charge carrier generation. Further, a decreasing time over threshold is observed for decreasing temperatures, which is associated to an increasing charge carrier mobility.
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