开尔文探针力显微镜
伏打电位
材料科学
表面光电压
接受者
静电力显微镜
显微镜
偶极子
化学物理
分子物理学
光电子学
纳米技术
光学
化学
原子力显微镜
凝聚态物理
物理
量子力学
有机化学
光谱学
作者
Franz Fuchs,Florent Caffy,Renaud Demadrille,Thierry Mélin,Benjamin Grévin
出处
期刊:ACS Nano
[American Chemical Society]
日期:2016-01-11
卷期号:10 (1): 739-746
被引量:62
标识
DOI:10.1021/acsnano.5b05810
摘要
We present noncontact atomic force microscopy and Kelvin probe force microscopy studies of nanophase segregated photovoltaic blends based on an oligothiophene-fluorenone oligomer and [6,6]-phenyl C70 butyric acid methyl ester. We carried out a complete analysis of the influence of the tip-surface interaction regime on the topographic, in-dark contact potential and surface photovoltage contrasts. It is demonstrated that an optimal lateral resolution is achieved for all channels below the onset of a contrast in the damping images. With the support of electrostatic simulations, it is shown that in-dark contact potential difference contrasts above subsurface acceptor clusters are consistent with an uneven distribution of permanent charges at the donor-acceptor interfaces. A remarkable dependence of the surface photovoltage magnitude with respect to the tip-surface distance is evidenced and attributed to a local enhancement of the electromagnetic field at the tip apex.
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