XPS studies of V2O5, V6O13, VO2 and V2O3

A detailed XPS study of several oxides of vanadium is reported in this work, in an attempt to characterize clearly the surface of these oxides. Several parameters, such as the FWHM of the v2p32 and O1s XPS peaks, their shape and binding energy difference, have been utilized. The characterization is extended to these oxides following different sample treatments. The effect of the presence or absence of adventitious carbon on the behaviour of the V2O5 sample is investigated when the sample is heated in UHV. It is found that the X-ray beam has some effect on the properties of both crystalline and polycrystalline V2O5 covered with Cd.