扩展X射线吸收精细结构
材料科学
拉伤
失真(音乐)
空位缺陷
光谱学
吸收(声学)
吸收光谱法
结晶学
凝聚态物理
光学
物理
复合材料
量子力学
光电子学
化学
内科学
医学
放大器
CMOS芯片
作者
Anna Kossoy,Anatoly I. Frenkel,Qi Wang,Ellen Wachtel,Igor Lubomirsky
标识
DOI:10.1002/adma.200902041
摘要
Extended X-ray absorption fine structure spectroscopy (EXAFS) was used to determine the interatomic distances in both strain-free and strained thin films of Ce0.8Gd0.2O1.9. It was found that in response to compressive strain, the Ce4+ ion undergoes an anomalously large shift away from the oxygen vacancy. This finding offers a microscopic explanation for the elastic anomalies observed in Ce0.8Gd0.2O1.9. Detailed facts of importance to specialist readers are published as "Supporting Information". Such documents are peer-reviewed, but not copy-edited or typeset. They are made available as submitted by the authors. Please note: The publisher is not responsible for the content or functionality of any supporting information supplied by the authors. Any queries (other than missing content) should be directed to the corresponding author for the article.
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