佩多:嘘
材料科学
聚(3,4-亚乙基二氧噻吩)
镜面反射
光电子学
光学
复合材料
聚合物
物理
作者
Joseph Troughton,Bastien Marchiori,Roger Delattre,S. Escoubas,M.Y. Aliouat,Souren Grigorian,Marc Ramuz
出处
期刊:Data in Brief
[Elsevier]
日期:2021-04-01
卷期号:35: 106946-106946
被引量:1
标识
DOI:10.1016/j.dib.2021.106946
摘要
Here is presented raw and analysed data collected during study of the evolution, with uniaxial stretching, of the electrical and microcrystalline characteristics of polystyrene sulfonate doped poly(3,4-ethylenedioxythiophene) (PEDOT:PSS) organic electrochemical transistors (OECTs). X-ray diffraction data from GIWAXS measurements of the PEDOT:PSS material, performed at the SOLEIL light source are presented in raw and partially analysed forms. Current-voltage data, collected concurrently with the GIWAXS data, are also presented, and the evolution of the transconductance of the OECT devices with stretching is shown. GIWAXS data are only examined along the qz specular reflection ridge, and scans along this ridge are extracted and presented. However, the off-specular data may also be of interest to readers and is therefore made available here in its entirety.
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