蚀刻(微加工)
半导体工业
纳米技术
原子层沉积
工程物理
半导体
微电子
限制
材料科学
反应离子刻蚀
硅
图层(电子)
工程类
光电子学
机械工程
制造工程
作者
Keren J. Kanarik,Thorsten Lill,Eric A. Hudson,Saravanapriyan Sriraman,Samantha Tan,Jeffrey M. Marks,V. Vahedi,Richard A. Gottscho
出处
期刊:Journal of vacuum science & technology
[American Institute of Physics]
日期:2015-03-01
卷期号:33 (2)
被引量:497
摘要
Atomic layer etching (ALE) is a technique for removing thin layers of material using sequential reaction steps that are self-limiting. ALE has been studied in the laboratory for more than 25 years. Today, it is being driven by the semiconductor industry as an alternative to continuous etching and is viewed as an essential counterpart to atomic layer deposition. As we enter the era of atomic-scale dimensions, there is need to unify the ALE field through increased effectiveness of collaboration between academia and industry, and to help enable the transition from lab to fab. With this in mind, this article provides defining criteria for ALE, along with clarification of some of the terminology and assumptions of this field. To increase understanding of the process, the mechanistic understanding is described for the silicon ALE case study, including the advantages of plasma-assisted processing. A historical overview spanning more than 25 years is provided for silicon, as well as ALE studies on oxides, III–V compounds, and other materials. Together, these processes encompass a variety of implementations, all following the same ALE principles. While the focus is on directional etching, isotropic ALE is also included. As part of this review, the authors also address the role of power pulsing as a predecessor to ALE and examine the outlook of ALE in the manufacturing of advanced semiconductor devices.
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