太赫兹辐射
宽带
谐波
材料科学
谐波分析
光电子学
太赫兹超材料
太赫兹间隙
电子工程
光学
物理
声学
工程类
远红外激光器
激光器
作者
Divya Jayasankar,Theodore Reck,Steven Durant,Jan Stake,Jeffrey L. Hesler
标识
DOI:10.1109/tthz.2024.3368660
摘要
This letter presents an experimental characterization technique for assessing the performance of terahertz harmonic mixers across a wide frequency range. The total signal transfer loss of three mixers was measured in both up- and down-conversion configurations, and the conversion loss wasdetermined through the solution of a linear system of equations. The proposed method uses LO signals with a frequency offset to ensure single sideband measurements, thereby eliminating the need for image-reject filters. The three-mixer method was verified by measurements of millimeter-wave mixers, which matched the traditional characterization method using a calibrated source and power meter. Given this successful millimeter-wave demonstration, we characterized three WM-86 Schottky diode ×4-harmonic mixers from 2.2 to 3 THz. This technique presents a notable advantage for conducting broadband mixer characterizations, particularly in the terahertz frequency regime which lacks tunable, wide-band sources.
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