氧烷
化学
铀
分析化学(期刊)
X射线荧光
光谱学
氧化态
吸收(声学)
同步加速器
吸收光谱法
X射线吸收光谱法
X射线光谱学
谱线
K-边
全内反射
荧光光谱法
荧光
材料科学
光学
金属
物理
复合材料
量子力学
有机化学
光电子学
冶金
色谱法
天文
作者
Kaushik Sanyal,Ajay Khooha,Gangadhar Das,Mahesh Tiwari,N. L. Misra
标识
DOI:10.1021/acs.analchem.6b03945
摘要
Total reflection X-ray fluorescence (TXRF)-based X-ray absorption near-edge spectroscopy has been used to determine the oxidation state of uranium in mixed-valent U3O8 and U3O7 uranium oxides. The TXRF spectra of the compounds were measured using variable X-ray energies in the vicinity of the U L3 edge in the TXRF excitation mode at the microfocus beamline of the Indus-2 synchrotron facility. The TXRF-based X-ray absorption near-edge spectroscopy (TXRF-XANES) spectra were deduced from the emission spectra measured using the energies below and above the U L3 edge in the XANES region. The data processing using TXRF-XANES spectra of U(IV), U(V), and U(VI) standard compounds revealed that U present in U3O8 is a mixture of U(V) and U(VI), whereas U in U3O7 is mixture of U(IV) and U(VI). The results obtained in this study are similar to that reported in literature using the U M edge. The present study has demonstrated the possibility of application of TXRF for the oxidation state determination and elemental speciation of radioactive substances in a nondestructive manner with very small amount of sample requirement.
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