Update in a Rietveld analysis program for x-ray powder spectro-diffractometry

A computer program for refining anomalous scattering factors using x-ray powder diffraction data was revised on the basis of the latest version of a versatile pattern-fitting system, RIETAN-2000 . The effectiveness of the resulting program was confirmed by applying it to simulated and measured powder-diffraction patterns of Mn 3 O 4 taken at a synchrotron light source.