碳化硅
二极管
制作
材料科学
宽禁带半导体
工程物理
电源模块
功率半导体器件
范围(计算机科学)
功率(物理)
肖特基二极管
硅
电子工程
电力电子
碳化物
电压
计算机科学
光电子学
电气工程
工程类
物理
病理
复合材料
冶金
医学
程序设计语言
替代医学
量子力学
作者
Anastasios Arvanitopoulos,Marina Antoniou,Samuel Perkins,Michael R. Jennings,Manuel Belanche Guadas,Konstantinos N. Gyftakis,Neophytos Lophitis
标识
DOI:10.1109/tia.2019.2911872
摘要
Major recent developments in growth expertise related to the cubic polytype of Silicon Carbide, the 3C-SiC, coupled with its remarkable physical properties and the low fabrication cost, suggest that within the next years, 3C-SiC devices can become a commercial reality. Inevitably, a comparison to the most well-developed polytype of SiC, the 4H-SiC, should exist. It is, therefore, important to develop finite element method techniques and models for accurate device design, analysis, and comparison. It is also needed to perform an exhaustive investigation with scope to identify which family of devices, which voltage class, and for which applications this polytype is best suited. In this paper, we validate the recently developed technology computer-aided design (TCAD) material models for 3C-SiC and those of 4H-SiC with measurements on power diodes. An excellent agreement between measurements and TCAD simulations was obtained. Thereafter, based on this validation, 3C- and 4H-SiC vertical power diodes are assessed to create trade-off maps. Depending on the operation requirements imposed by the application, the developed tradeoff maps set the boundary of the realm for those two polytypes and allows to predict which applications would benefit once electrically graded 3C-SiC becomes available.
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