X射线光电子能谱
原位
材料科学
表征(材料科学)
催化作用
电解质
分析化学(期刊)
谱线
化学工程
光谱学
激发
航程(航空)
电子光谱学
氧化还原
环境压力
紫外光电子能谱
纳米技术
光化学
作者
Iris C. G. van den Bosch,Jahid Uz Zaman,Genrikh Shterk,Mai Hussein Hamed,M. Schneider,Vadim Ratovskii,Yibin Bu,Paul Dietrich,Gertjan Koster,Christoph Baeumer
出处
期刊:Science Advances
[American Association for the Advancement of Science]
日期:2025-08-22
卷期号:11 (34): eadw6673-eadw6673
标识
DOI:10.1126/sciadv.adw6673
摘要
Innovative approaches to study buried interfaces and heterogeneous interactions under reaction conditions are crucial for advancing energy and catalytic materials. Our near-ambient pressure x-ray photoelectron spectroscopy (NAP-XPS) setup is equipped with a tricolor x-ray source, with Al Kα, Ag Lα, and Cr Kα excitation energies, enabling information depth–selective operando and in situ analysis of solid-liquid, solid-gas, and solid-solid interfaces. We present three case studies to demonstrate the systems’ capabilities. First, we compare experimental depth profiling of a LaMnO 3 /LaFeO 3 /Nb:SrTiO 3 multilayer with SESSA (simulation of electron spectra for surface analysis) simulations. Second, we examine the oxidation and reduction of Fe x O y as a function of environment and temperature. Last, the Pt/liquid electrolyte interface is examined, revealing surface oxidation in the absence of bulk oxidation. As our results confirm, the unique combination of a NAP-XPS with the tricolor x-ray source empowers laboratory-based in situ and operando XPS characterization of advanced materials under reaction conditions in a wide range of applications.
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