数码产品
半导体
材料科学
电介质
高-κ电介质
磷烯
纳米技术
二硫化钼
带隙
栅极电介质
晶体管
泄漏(经济)
光电子学
氧化物
纳米电子学
宽禁带半导体
工程物理
柔性电子器件
电子工程
化学气相沉积
作者
Tong Yang,Jingyu He,Keda Ding,Ke Yang,Wei Han,Minggang Zeng,Yulin Yang,Jiong Zhao,Yang Chai,Shu Ping Lau,Kian Ping Loh,Jun Zhou,Ming Yang
出处
期刊:ACS Nano
[American Chemical Society]
日期:2025-10-01
卷期号:19 (40): 35812-35824
被引量:1
标识
DOI:10.1021/acsnano.5c12416
摘要
Inorganic molecular crystals (IMCs) hold great promise as high-κ dielectrics for two-dimensional (2D) electronics due to their dangling-bond-free surfaces and the capability of direct integration on 2D semiconductors. However, only a limited number of IMCs have been identified so far, and interface properties between IMC-based high-κ dielectrics and 2D semiconductors remain largely unexplored. Here, we present an efficient high-throughput screening of IMC-based high-κ dielectrics from a large materials database, of which 6 IMCs (Sb2S2O9, two Bi2O3 phases, As2S2O9, Sb2O3, and Te2H2O3F4) have been predicted to be the most promising gate dielectrics for 2D semiconductors due to their optimal trade-off between dielectric constant and band gap, as well as facile growth possibility. For predominant 2D semiconducting channel materials such as molybdenum disulfide (MoS2) and black phosphorene (BP), the respective promising IMC-based high-κ dielectrics have been pinpointed. We further showcase two high-performance 2D semiconductor/IMC interfaces (BP/Sb2S2O9 and MoS2/Bi2O3), as evidenced by large band offsets, high defect tolerance, and low leakage current. The downscaling capability of the IMCs to the sub-1 nm equivalent oxide thickness (EOT) regime is also unraveled for both dynamic random access memory (DRAM) and central processing unit (CPU) applications. Our results accelerate the exploration of IMC-based high-κ dielectrics and promote the development of high-performance 2D electronics.
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