Automatic classification of EUV mask defects inspected using DUV inspection optics
极紫外光刻
光学
计算机科学
人工智能
物理
作者
Aravindh Rajiv,Venkata Rama Samir Bhamidipati,Mark P. Pereira,Sankaranarayanan Paninjath,Neha Razdan,Stephen H. Kim,Jin‐Hyuk Choi,Jonghoon Lim,Sujeong Won,Dong-Wook Lee,Woo Jin Kim,Jongha Park