平版印刷术
小型化
计算光刻
光刻
下一代光刻
X射线光刻
纳米技术
材料科学
光电子学
抵抗
电子束光刻
图层(电子)
作者
Takashi Ito,Shinji Okazaki
出处
期刊:Nature
[Nature Portfolio]
日期:2000-08-01
卷期号:406 (6799): 1027-1031
被引量:874
摘要
The phenomenal rate of increase in the integration density of silicon chips has been sustained in large part by advances in optical lithography--the process that patterns and guides the fabrication of the component semiconductor devices and circuitry. Although the introduction of shorter-wavelength light sources and resolution-enhancement techniques should help maintain the current rate of device miniaturization for several more years, a point will be reached where optical lithography can no longer attain the required feature sizes. Several alternative lithographic techniques under development have the capability to overcome these resolution limits but, at present, no obvious successor to optical lithography has emerged.
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