蚀刻(微加工)
材料科学
制作
介孔材料
溶解
光电子学
硅
纳米技术
各向同性腐蚀
调制(音乐)
纳米
大孔隙
模式(计算机接口)
可扩展性
化学机械平面化
干法蚀刻
过程(计算)
基质(水族馆)
电化学
化学气相沉积
科技与社会
作者
Doohong Min,Taeyeong Kim,Kibum Jung,Jongho Lee
标识
DOI:10.1109/mems64181.2026.11419508
摘要
We demonstrate that backside-illuminated photoelectrochemical (PEC) etching enables deterministic control over mode transitions in silicon pore arrays, extending wet etching beyond conventional high-aspectratio formation. By combining photoelectrochemical dissolution with coordinated modulation of bias voltage, illumination, and HF concentration, we achieve stable macropore growth with aspect ratios up to $\sim 35$ within 80 minutes etching. This approach further allows in situ engineering of mesoporous domains and controlled undulations within pore structures. Such tunability establishes backside-illuminated PEC as a scalable platform for precision pore morphology control, with broad implications for through-silicon vias (TSVs), MEMS, and advanced 3D integration.
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