薄膜晶体管
背板
材料科学
光电子学
晶体管
阈下传导
图层(电子)
可靠性(半导体)
电极
平板显示器
电气工程
纳米技术
工程类
电压
化学
物理化学
功率(物理)
物理
量子力学
作者
Jiangbo Yao,Kai Zhou,Chuanbao Luo,Macai Lu,Junbiao Peng,Xin Zhang
摘要
In this work, a novel thin film transistor (TFT) structure named ASD was prepared, which means active layer bottom‐contact with source/drain(SD) layer. ASD device use the first light shield metal layer served as SD electrode simultaneously, which can reduce 2‐count‐mask array process compared with traditional top gate (TG) device. The mobility and subthreshold swing of the ASD a‐IGZO TFT device can reach 14 cm2/Vs and 0.18 V/dec, respectively. The PBTS and NBTIS are within 0.5V through process optimization. In addition, a 7.1 inch Micro‐LED display used ASD TFT backplane has demonstrated, and Finally, the Micro‐LED panel shows +0.7V Vth shift after the high temperature and high humidity operation (HTHHO) 500h reliability test.
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