溅射沉积
材料科学
铜
类金刚石碳
涂层
腔磁控管
抗菌剂
兴奋剂
碳纤维
溅射
冶金
复合材料
纳米技术
薄膜
化学
光电子学
有机化学
复合数
作者
Takayuki Ohta,Yuto Kamiya
标识
DOI:10.35848/1347-4065/acddbf
摘要
Abstract Copper-doped diamond-like carbon (Cu-DLC) film was deposited using dual magnetron sputtering to develop an antimicrobial coating. The Cu content in the DLC film ranged from 0.3 at% to 40 at% by varying the duty ratio of the pulsed voltage applied to the copper target. The graphite structure (sp 2 bond) in the Cu-DLC film increased with increasing Cu content. The antimicrobial effect of Cu-DLC on Escherichia coli was examined by the colony-count method. E. coli was inactivated at a Cu content of 0.3 at% and the inactivation rate increased with increasing Cu content. This antimicrobial effect was obtained while maintaining hardness at a low Cu content using dual magnetron sputtering.
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