范德瓦尔斯力
反铁磁性
物理
凝聚态物理
量子力学
分子
作者
Lanxin Jia,Zhenyi Zheng,Xiwen Zhang,Qihan Zhang,Sheila Sim,Tieyang Zhao,Youdi Gu,Tao Zeng,Rui Xiao,Shu Shi,Jing Wu,Lei Shen,Kostya S. Novoselov,Jingsheng Chen
出处
期刊:Physical review
[American Physical Society]
日期:2024-12-06
卷期号:110 (21)
被引量:1
标识
DOI:10.1103/physrevb.110.214411
摘要
As a typical nonlinear magnetoresistance, unidirectional magnetoresistance (UMR) has recently been observed in antiferromagnetic (AFM) systems with canted spin structure. However, a profound understanding of AFM UMR induced by interfacial spin-orbit coupling (SOC) is still lacking to date. In this paper, we choose van der Waals canted antiferromagnetic $\mathrm{CrP}{\mathrm{S}}_{4}$ due to the relatively low magnetic anisotropy and weak interlayer coupling, which enables a canted-AFM state between two adjacent layers under an in-plane magnetic field, and systematically investigate SOC-induced AFM UMR in $\mathrm{CrP}{\mathrm{S}}_{4}/\mathrm{Pt}$ heterostructure. We experimentally observe two characteristic UMR tendencies versus magnetic field in $\mathrm{CrP}{\mathrm{S}}_{4}/\mathrm{Pt}$ devices. The different UMR tendencies may be attributed to the interfacial defect-induced Fermi level change, which is supported by density-functional theory calculations and Boltzmann transport formalism. Our work provides a more profound understanding of the nontrivial AFM UMR and may facilitate the development of two-dimensional AFM spintronic devices.
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