ADAPTATIVE BACKTRACE AND DYNAMIC PARTITIONING ENHANCE ATPG

In order to speed up test generation for digital circuits, an adaptative backtrace technique is proposed. It avoids unnecessary internal conflicts of previous algorithms and reduces the number of backtracks while searching for a test. Additionally, the circuit under test is dynamically partitioned into useful and useless elements to reduce circuit complexity. An automatic system has been developed following these guidelines and it has proved effective in generating test for large circuits.