散光
域代数上的
数学
相似性(几何)
物理
纯数学
计算机科学
图像(数学)
光学
人工智能
出处
期刊:British Journal of Applied Physics
[IOP Publishing]
日期:1967-04-01
卷期号:18 (4): 543-544
标识
DOI:10.1088/0508-3443/18/4/123
摘要
An algebra has been devised in which axial asymmetries, such as those causing astigmatism in electron lenses, may be treated directly. The extent to which the algebra has been developed is indicated. Although originally devised for use in electron microscopy, the algebra can be generalized and then shows a similarity to existing aberration theories and aberration correction systems. The nature and extent of this relationship is under consideration.
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