On the spectral resolution of a focusing Bragg spectrometer

The influence of the intensity profile of a wave, focused upon backscattering from a bent crystal, on the spectral resolution of a focusing Bragg spectrometer dynamically reflecting short-wavelength X-ray radiation (λ∼1 Å) is considered in comparison to a nonfocusing flat-crystal spectrometer. Conditions necessary for resolving spectral lines in the spectrometers of both types are formulated.