光学
干涉测量
投影(关系代数)
计算机科学
物理
结构光三维扫描仪
计算机视觉
材料科学
光纤
图像分辨率
人工智能
作者
Xiaojie Li,Xiaojie Duan,Guangxu Li,Teng Cao,Rui Xie,Yanhua Hong,Chunxiao Tang,Enbang Li,Cheng Zhang,Hongqiang Li
标识
DOI:10.1117/1.oe.57.9.094105
摘要
We used a system that exploits the Mach–Zehnder interferometer structure and Young’s double-pinhole interference principle to measure the three-dimensional topographies of small objects at high precision. Next, we performed phase profilometry to measure small objects and achieve a height measurement within a 10 × 10-cm area. The accuracy of the measurement system improved by 44.1%, and the measurement time was reduced by 63.2%.
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