微晶
微探针
残余应力
各向异性
材料科学
陶瓷
压力(语言学)
荧光
单晶
热膨胀
光学
分析化学(期刊)
矿物学
复合材料
结晶学
化学
冶金
物理
色谱法
哲学
语言学
作者
Qing Ma,David R. Clarke
标识
DOI:10.1111/j.1151-2916.1993.tb03922.x
摘要
A general methodology is developed for determining the state of stress and the numerical value of the stresses from observed shifts and broadening of optical fluorescence lines. The method is based on the piezospectroscopic properties of single crystals. We present general relationships between the measured fluorescence shifts and the stress state for a number of illustrative cases, pertinent to both polycrystalline and single‐crystal ceramics under stress. These include measuring the stresses applied to polycrystalline ceramics, the residual stress distribution due to crystallographically anisotropic thermal expansion, and the stresses applied to single crystals. Using the recently implemented technique of performing the fluorescence measurements in an optical microprobe, we also provide experimental tests of the relationships derived.
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