bilayer thin films alongwith pure ZnTe thin film were prepared onto glass substrate by thermal evaporation method under the vacuum of 10-5 Torr. Thickness of these thin films is determined by ellipsometric measurements. The optical band gap of 2.4 eV for ZnTe thin film decreased to 1.6 eV for ZnTe / Zn0.8Cr0.2Te bilayer thin film by analyzing the optical absorbance spectra observed using Uv-Vis spectroscopy. Surface topography of these films done by optical microscopy is also reported here.