材料科学
烧结
可靠性(半导体)
复合数
铜
电子包装
复合材料
电力电子
数码产品
冶金
功率(物理)
电气工程
工程类
量子力学
物理
作者
Xinyue Wang,Zhoudong Yang,Lifang Bian,Wenting Liu,Guoqi Zhang,Jing Zhang,Chuantong Chen,Pan Liu
标识
DOI:10.1016/j.jsamd.2025.100963
摘要
While silver-based sintered materials are limited by cost and electromigration, and copper faces challenges with oxidation at high temperatures, Cu-based composite sintering materials offer promising alternative solutions. This review examines recent advances in Cu-based composite sintered materials for die-attach in power electronics packaging, focusing on their mechanical, thermal, electrical properties, and reliability. This review systematically categorizes such compounding strategies, including direct mixing, core-shell structures, and alloying, analyzing the impact on composite properties. Furthermore, the reliability of Cu-based composite sintered joints is evaluated, addressing high-temperature storage, thermal cycling, corrosion, and electrochemical migration. Challenges such as oxidation resistance, process optimization, and cost-effectiveness are discussed, together with future research directions. This work aims to support researchers in advancing Cu-based composite sintering materials research and development, broadening material options for high-temperature power electronics packaging applications.
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