High-Dynamic-Range Detection of Microwave Signal on Chip Surface Based on Diamond Sensors

This article proposed a microwave (MW) detection method by utilizing the effect of the dual MW on nitrogen-vacancy (NV) centers in diamond. We established a theoretical model of dual MW superposition and experimentally discovered the unusual peak in the optically detected magnetic resonance (ODMR) spectrum. The peak frequency and the full-width at half-maximum of the unusual peak, as well as fluorescence intensity in the nonresonant frequency range of the ODMR spectrum, were systematically analyzed to obtain the frequency and amplitude of the measured MW signals. The broadband MW detection was realized in a wide range of 2240–4512 MHz by utilizing the linear relation between the magnetic field and the resonant frequency in the Zeeman splitting. The experiments showed that the minimum detection power was up to 1 $\mu$ W. The proposed approach can greatly improve the practicability of detecting MW fields on chip surfaces by quantum engineering techniques.