Pulsed Force Kelvin Probe Force Microscopy through Integration of Lock-In Detection

Kelvin probe force microscopy measures surface potential and delivers insights into nanoscale electronic properties, including work function, doping levels, and localized charges. Recently developed pulsed force Kelvin probe force microscopy (PF-KPFM) provides sub-10 nm spatial resolution under ambient conditions, but its original implementation is hampered by instrument complexity and limited operational speed. Here, we introduce a solution for overcoming these two limitations: a lock-in amplifier-based PF-KPFM. Our method involves phase-synchronized switching of a field effect transistor to mediate the Coulombic force between the probe and the sample. We validate its efficacy on two-dimensional material MXene and aged perovskite photovoltaic films. Lock-in-based PF-KPFM successfully identifies the contact potential difference (CPD) of stacked flakes and finds that the CPDs of monoflake MXene are different from those of their multiflake counterparts, which are otherwise similar in value. In perovskite films, we uncover electrical degradation that remains elusive with surface topography.