RESEARCH ON GRAIN-BOUNDARY MIGRATION IN ALUMINUM BICRYSTALS

The activation energy of grain boundary migration has been determined to be 23 kcal/mol for single crystalline aluminum wires and 44 kcal/mol for polycrystalline wires. Herewith a model is confirmed after which the upper limit is given by lattice self diffusion, the lower limit by grain boundary self diffusion. The dependence of the migration speed of grain boundaries on the thickness of the specimen is discussed. (auth)