掺杂剂
铝
化学
卤化物
密度泛函理论
硅
分子
原子单位
扫描隧道显微镜
无机化学
纳米技术
计算化学
材料科学
兴奋剂
有机化学
光电子学
物理
量子力学
作者
James H. G. Owen,Quinn Campbell,Robin Santini,Jeffrey Ivie,Andrew Baczewski,Scott Schmucker,Ezra Bussmann,Shashank Misra,John N. Randall
标识
DOI:10.1088/1361-648x/ac1ddf
摘要
Atomically precise ultradoping of silicon is possible with atomic resists, area-selective surface chemistry, and a limited set of hydride and halide precursor molecules, in a process known as atomic precision advanced manufacturing (APAM). It is desirable to expand this set of precursors to include dopants with organic functional groups and here we consider aluminium alkyls, to expand the applicability of APAM. We explore the impurity content and selectivity that results from using trimethyl aluminium and triethyl aluminium precursors on Si(001) to ultradope with aluminium through a hydrogen mask. Comparison of the methylated and ethylated precursors helps us understand the impact of hydrocarbon ligand selection on incorporation surface chemistry. Combining scanning tunneling microscopy and density functional theory calculations, we assess the limitations of both classes of precursor and extract general principles relevant to each.
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