材料科学
腐蚀坑密度
钌
蚀刻(微加工)
锡
钴
纳米技术
化学工程
分析化学(期刊)
无机化学
冶金
催化作用
化学
图层(电子)
环境化学
有机化学
工程类
作者
Chien Pin Sherman Hsu,Polly Yi Ting Chen
标识
DOI:10.4028/www.scientific.net/ssp.314.307
摘要
Selective Cobalt (Co) and Ruthenium (Ru) etch chemistries are developed to provide controlled etch options with various metallization, including Al, Cu, W, Co, Ru, TiN and TaN. The pH effects on Co, Cu and W etching are reported. Diluted acids, such as 1% HF and 1% HCl, demonstrate etch rate profiles suitable for selective Co vs. W etch applications. Ru etch chemistries are alkaline oxidative based and expanded to meet 3 nm and below integration needs. Versatile applications include highly boosted Ru etch rates for thermally annealed Ru layers and TiN compatible WNx or WCN selective etching at ultra-dilutions.
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