光电探测器
光电子学
响应度
材料科学
带宽(计算)
光子学
暗电流
碳纳米管
硅
带隙
氮化硅
波长
电子线路
光子集成电路
直接和间接带隙
光通信
探测器
集成电路
光学
硅光子学
宽禁带半导体
作者
Haoyu Zhang,Hongyan Zhao,Jiayi Li,Zihan Yang,Xinyi Zheng,Mingyue Fu,Weifeng Wu,Hao He,Hui Wang,X Y Luo,Yiling Hu,Zhipeng Liu,Buwen Cheng,Jun Zheng,Lin Chang,Shimin Hou,S Wang
出处
期刊:ACS Nano
[American Chemical Society]
日期:2026-04-24
卷期号:20 (17): 13339-13350
标识
DOI:10.1021/acsnano.6c03202
摘要
As data transmission rates scale toward unprecedented capacities, both the conventional 1.55 μm telecommunication band and the emerging 2 μm band require photodetectors with large electrical bandwidth and high responsivity. Although mature Ge- and III–V-based photodetectors can operate fast at 1.55 μm band, there cannot work efficiently at 2 μm band because of band gap and material quality. Here we report a waveguide-integrated carbon nanotube (CNT) photodetector on a silicon nitride (SiN x ) platform that delivers high performance across both wavelength regimes. At 1.55 μm and a bias of −1 V, the device exhibits a 3 dB bandwidth exceeding 67 GHz. At 2 μm, it maintains a low dark current of 80 nA and a responsivity of 0.41 A/W, while delivering a similarly setup-limited 3 dB bandwidth beyond 67 GHz. This bandwidth represents a significant leap over previously reported photodetectors operating in this spectral regime. Our findings position CNT photodetectors as a promising platform for CMOS-compatible, high-speed optical interconnects across both the 1.55 and 2 μm bands. Furthermore, the demonstrated high-speed performance underscores their potential to underpin the next generation of large-scale photonic and optoelectronic integrated circuits (OEICs).
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